A Position-Sensitive Proportinal Counter for Residual Stress Measurement by means of Microbeam X-Rays

Abstract

AbstractA position-sensitive proportional counter (PSPC) with high counting efficiency has been made for stress analysis with low intensity X-rays such as microbeam X-rays.This PSPC system has made it possible to measure the residual stress in a small region such as a fatigue crack tip in very short time compared with the measurement by standard diffractometer or film methods.