Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter

Abstract

A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps.The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.