An Introduction to Logic Circuit Testing
Author:
Publisher
Morgan & Claypool Publishers LLC
Subject
Electrical and Electronic Engineering
Reference51 articles.
1. W. Maly, P. Nag, and P. Nigh , "Testing oriented analysis of CMOS ICs with opens ,"Proc. Intl. Conf. CAD, 344-7(1988 ). doi:10.1109/ICCAD.1988.122525
2. M. W. David , "An optimized delay testing technique for LSSD-based VLSI logic circuits ,"IEEE VLSI Test Symp., 239-46(1991 ).
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