Sensitivity enhancement of far-infrared Fizeau interferometry by digital image processing
Author:
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference15 articles.
1. Warpage Measurement on Dielectric Rough Surfaces of Microelectronics Devices by Far Infrared Fizeau Interferometry1
2. Quasi-Heterodyne Hologram Interferometry
3. Heterodyne And Quasi-Heterodyne Holographic Interferometry
4. Automated fringe pattern analysis for moiré interferometry
5. A comparison of phase shifting and fourier methods in the analysis of discontinuous fringe patterns
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