Author:
Postek Michael T.,Vladár András E.
Cited by
3 articles.
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1. Contour metrology using critical dimension atomic force microscopy;Journal of Micro/Nanolithography, MEMS, and MOEMS;2016-12-15
2. Determination of Nanoparticle Surface Coatings and Nanoparticle Purity Using Microscale Thermogravimetric Analysis;Analytical Chemistry;2014-01-17
3. Does your SEM really tell the truth? Part 2;Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences;2013-05-29