Modeling mark edge jitter in phase-change recording-Reference-Cited by-同舟云学术

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Modeling mark edge jitter in phase-change recording

Published:2000-09-18 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Sheila Aparna C.,Lambeth David N.,Schlesinger Tuviah E.

Publisher

SPIE

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanophase Change for Data Storage Applications;Journal of Nanoscience and Nanotechnology;2007-01-01

2. Theoretical Limit to Domain Position Detection Magnetic Amplifying Magnetooptical System;IEEE Transactions on Magnetics;2004-01

3. The study of crystallization process of as-deposited amorphous phase change-materials by in situ annealing experiments;SPIE Proceedings;2003-09-16

4. Method and physical mechanism of initialization-free phase-change optical recording;Journal of Physics: Condensed Matter;2003-03-10

5. Three Dimensional Crystallization Simulation and Recording Layer Thickness Effect in Phase Change Optical Recording;Japanese Journal of Applied Physics;2003-02-28

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