The range of VCSEL wearout reliability acceleration behavior and its effects on applications

Author:

Guenter James,Graham Luke,Hawkins Bobby,Hawthorne Robert,Johnson Ralph,Landry Gary,Tatum Jim

Publisher

SPIE

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs;IEEE Photonics Journal;2024-06

2. Temperature Distribution Measurement System for a Water-Cooled CPO Daughter Board;2023 IEEE CPMT Symposium Japan (ICSJ);2023-11-15

3. VCSEL Industry;VCSEL Industry;2021-11-24

4. A QSFP28 AOC Employing Solderable 28-Gb/s × 4-Channel Transceiver Modules;Journal of The Japan Institute of Electronics Packaging;2019-01-01

5. Volume Manufacturable High speed 850nm VCSEL for 100G Ethernet and Beyond;Optical Fiber Communication Conference;2016

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