1. International technology roadmap for semiconductors (ITRS) 2013, http://www.itrs.net/
2. Accurate models for EUV lithography;Hendrickx,2009
3. Mask Process Correction (MPC) modeling and its application to EUV mask for Electron beam mask writer, EBM-7000;Kamikubo,2010
4. Entering Mask Process Correction era for EUV mask manufacturing;Burgel,2013
5. Exploring the fundamental limit of CD control: shot noise and CD uniformity improvement through resist thickness;Yu,2005