Electron beam mask writer EBM-9500 for logic 7nm node generation

Author:

Matsui Hideki1,Kamikubo Takashi1,Nakahashi Satoshi1,Nomura Haruyuki1,Nakayamada Noriaki1,Suganuma Mizuna1,Kato Yasuo1,Yashima Jun1,Katsap Victor2,Saito Kenichi1,Kobayashi Ryoei1,Miyamoto Nobuo1,Ogasawara Munehiro1

Affiliation:

1. NuFlare Technology, Inc. (Japan)

2. NuFlare Technology, Inc. (United States)

Publisher

SPIE

Reference10 articles.

1. International technology roadmap for semiconductors (ITRS) 2013, http://www.itrs.net/

2. Accurate models for EUV lithography;Hendrickx,2009

3. Mask Process Correction (MPC) modeling and its application to EUV mask for Electron beam mask writer, EBM-7000;Kamikubo,2010

4. Entering Mask Process Correction era for EUV mask manufacturing;Burgel,2013

5. Exploring the fundamental limit of CD control: shot noise and CD uniformity improvement through resist thickness;Yu,2005

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1. Recent progress and future of electron multi-beam mask writer;Japanese Journal of Applied Physics;2023-02-17

2. Study of EB resist dissolution contrast and chemical blur impact on the ultimate resolution;Photomask Technology 2022;2022-12-01

3. Study on physical model of resist surface charge in electron beam mask writer EBM-9500PLUS;Photomask Technology 2020;2020-09-20

4. Requirements of data technology for EUV photomask;Photomask Technology 2019;2019-09-26

5. Multi-beam mask writer MBM-1000;Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019;2019-03-26

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