Focus measure method based on the modulus of the gradient of the color planes for digital microscopy
Author:
Affiliation:
1. Universidad Politécnica de Tulancingo, Computer Science Department, Tulancingo
2. Instituto Nacional de Astrofísica, Óptica y Electrónica, Tonanzintla
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference34 articles.
1. Simple and robust image-based autofocusing for digital microscopy
2. Autofocus using image phase congruency
3. Autofocus evaluation for brightfield microscopy pathology
4. Microscopy Research and Technique
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