Author:
Guenter James,Mathes David,Hawkins Bobby,Tatum Jim
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Reliability and failure mode analysis of high-speed 850-nm multi-mode and 795-nm single-mode VCSELs for space applications;Vertical-Cavity Surface-Emitting Lasers XXVIII;2024-03-13
2. Reliability and failure mode analysis of high-speed 850-nm oxide-confined multi-mode VCSELs for space applications;Vertical-Cavity Surface-Emitting Lasers XXVII;2023-03-15
3. Analysis of common failure causes in oxide VCSELs;International Conference on Optoelectronic Materials and Devices (ICOMD 2021);2022-02-16
4. Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers;Materials and Reliability Handbook for Semiconductor Optical and Electron Devices;2012-08-23
5. Failure Analysis of Semiconductor Optical Devices;Materials and Reliability Handbook for Semiconductor Optical and Electron Devices;2012-08-23