Analysis of common failure causes in oxide VCSELs-Reference-Cited by-同舟云学术

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Analysis of common failure causes in oxide VCSELs

Published:2022-02-16 Issue: Volume: Page:
ISSN:
Container-title:International Conference on Optoelectronic Materials and Devices (ICOMD 2021)
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Author:

Zhang Yuqi,Zhao Jia

Publisher

SPIE

Reference45 articles.

1. Infrared and Laser Engineering

2. Research Progress of Vertical-cavity Surface-emitting Laser

3. Forty years of vertical-cavity surface-emitting laser: Invention and innovation

4. Development of semiconductor laser;Chen;Chinese Journal of Lasers,2020

5. Failure Mechanism and Detection Analysis of Semiconductor Laser;Sun;Laser & Optoelectronics Progress,2021

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review on Single-Mode Vertical-Cavity Surface-Emitting Lasers for High-Speed Data Transfer;Reviews on Advanced Materials and Technologies;2022

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