Dual-arm multiple-reflection Michelson interferometer for large multiple reflections and increased sensitivity-Reference-Cited by-同舟云学术

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Dual-arm multiple-reflection Michelson interferometer for large multiple reflections and increased sensitivity

Published:2016-02-15 Issue:2 Volume:55 Page:024101
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Joenathan Charles¹,Bernal Ashley²,Woonghee Youn¹,Bunch Robert M.¹,Hakoda Christopher³

Affiliation:

1. Rose-Hulman Institute of Technology, Department of Physics and Optical Engineering, 5500 Wabash Avenue, Terre Haute, Indiana 47803, United States

2. Rose-Hulman Institute of Technology, Department of Mechanical Engineering, 5500 Wabash Avenue, Terre Haute, Indiana 47803, United States

3. Pennsylvania State University, Department of Engineering Science and Mechanics, 201 Old Main, University Park, Pennsylvania 16802, United States

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference15 articles.

1. Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry

2. Small-displacement sensing system based on multiple total internal reflections in heterodyne interferometry;Wang,2009

3. Vacuum measurement using total-internal-reflection heterodyne interferometry

4. U-shaped optical fiber sensor based on multiple total internal reflections in heterodyne interferometry

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Phase-shifting determination and pattern recognition using a modified Sagnac interferometer with multiple reflections;Applied Optics;2024-01-29

2. Modified Cyclic Interferometer for measurement of nanoradian tilt with multifold sensitivity;Optics Communications;2023-11

3. Michelson Interferometer with mirrored right-angled prism for measurement of tilt with double sensitivity;Journal of Optics;2023-08-01

4. Contributed Review: A review of compact interferometers;Review of Scientific Instruments;2018-12

5. Nanoscale tilt measurement using a cyclic interferometer with polarization phase stepping and multiple reflections;Applied Optics;2017-12-21

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