Author:
Meynants Guy,Dierickx Bart,Scheffer Danny
Cited by
55 articles.
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1. Heavy-ion beam test of a monolithic silicon pixel sensor with a new 130 nm High-Resistivity CMOS process;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2022-09
2. Fitting of track models;Particle Detectors;2020-06-30
3. Physical noise sources;Particle Detectors;2020-06-30
4. Laplace transform;Particle Detectors;2020-06-30
5. LPM effect;Particle Detectors;2020-06-30