Binary pseudo-random array test standard optimized for characterization of interferometric microscopes-Reference-Cited by-同舟云学术

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Binary pseudo-random array test standard optimized for characterization of interferometric microscopes

Published:2021-08-05 Issue: Volume: Page:
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Container-title:Applied Optical Metrology IV
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Author:

Munechika Keiko,Cabrini Stefano,Chao Weilun,Lacey Ian,Pina-Hernandez Carlos,Rochester Simon,Yashchuk Valeriy

Publisher

SPIE

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimisation of a neutron imaging system using the modulation transfer function;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-12

2. Binary pseudo-random array (BPRA) for inspection and calibration for cylindrical wavefront interferometry;Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems IV;2023-10-04

3. Aberration measurements by a Talbot wavefront sensor in the presence of intensity variations;Journal of the Optical Society of America B;2023-01-26

4. Towards super-resolution interference microscopy metrology of x-ray variable-line-spacing diffraction gratings: recent developments;Advances in X-Ray/EUV Optics and Components XVII;2022-10-04

5. Reliability investigation of the instrument transfer function calibration technique based on binary pseudo-random array standards;Advances in X-Ray/EUV Optics and Components XVII;2022-10-04

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