Narrow-linewidth tunable laser working at 633 nm suitable for industrial interferometry-Reference-Cited by-同舟云学术

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Narrow-linewidth tunable laser working at 633 nm suitable for industrial interferometry

Published:2015-06-22 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Minh Tuan Pham,Hucl Václav,Čížek Martin,Mikel Břetislav,Hrabina Jan,Řeřucha Šimon,Číp Ondřej,Lazar Josef

Publisher

SPIE

Reference9 articles.

1. Frequency Standards and Metrology

2. International comparison of eight semiconductor lasers stabilized on 127I at A=633 nm. Metrologia.;Zarka,2000

3. High-spectral-purity VCSELs for spectroscopy and sensors

4. DATA SHEET EYP-DBR-0633-00005-2000-BFY02-0000. http://www.eagleyard.com/. [online]. 4.5.2015 [cit. 2015-05-04].http://www.eagleyard.com/uploads/tx_tdoproductstorage/EYP-DBR-0633-00005-2000-BFY02-0000_01.pdf

5. HighFinesse Product Brochure.http://www.highfinesse.com/. [online]. 4.5.2015 [cit. 2015-05-04]. http://www.highfinesse.com/Brochure/LowRes/HighFinesse_Product_Brochure.pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Linewidth Measurement of a Narrow-Linewidth Laser: Principles, Methods, and Systems;Sensors;2024-06-05

2. Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode;Measurement Science and Technology;2017-02-16

3. Coordinate interferometric system for measuring the position of a sample with infrared telecom laser diode;SPIE Proceedings;2016-11-11

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