Linewidth Measurement of a Narrow-Linewidth Laser: Principles, Methods, and Systems

Author:

Chen Jia-Qi12,Chen Chao13ORCID,Sun Jing-Jing12,Zhang Jian-Wei1,Liu Zhao-Hui12,Qin Li1,Ning Yong-Qiang13,Wang Li-Jun13

Affiliation:

1. State Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

2. University of Chinese Academy of Sciences, Beijing 100049, China

3. Xiongan Innovation Institute, Chinese Academy of Sciences, Xiongan 071800, China

Abstract

Narrow-linewidth lasers mainly depend on the development of advanced laser linewidth measurement methods for related technological progress as key devices in satellite laser communications, precision measurements, ultra-high-speed optical communications, and other fields. This manuscript provides a theoretical analysis of linewidth characterization methods based on the beat frequency power spectrum and laser phase noise calculations, and elaborates on existing research of measurement technologies. In addition, to address the technical challenges of complex measurement systems that commonly rely on long optical fibers and significant phase noise jitter in the existing research, a short-delay self-heterodyne method based on coherent envelope spectrum demodulation was discussed in depth to reduce the phase jitter caused by 1/f noise. We assessed the performance parameters and testing conditions of different lasers, as well as the corresponding linewidth characterization methods, and analyzed the measurement accuracy and error sources of various methods.

Funder

National Key Research & Development Program of China

National Natural Science Foundation of China

Science and Technology Development Project of Jilin Province

Changchun Science and Technology Development Plan Project

Publisher

MDPI AG

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