Author:
Usman Abdullahi,Thonglim Pachara,Bhatranand Apichai,Pimanpang Samuk,Buranasiri Prathan
Reference13 articles.
1. Thickness measurement of multilayer film stack in perovskite solar cell using spectroscopic ellipsometry
2. Moisture effect of fingerprint using total internal reflection digital in-line holography
3. Utilization of the cyclic interferometer In polarization phase-shifting technique to determine the thickness of transparent thin-films;Kaewon;Opt. Appl,2020
4. Polarization phase-shifting technique for the determination of a transparent thin film’s thickness using a modified sagnac interferometer;Kaewon;Curr. Opt. Photonics,2018
5. A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry