Thickness measurement of multilayer film stack in perovskite solar cell using spectroscopic ellipsometry-Reference-Cited by-同舟云学术

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Thickness measurement of multilayer film stack in perovskite solar cell using spectroscopic ellipsometry

Published:2019-12-01 Issue:12 Volume:9 Page:125107
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Hasan Mehedhi¹,Lyon Kevin²,Trombley Lauren²,Smith Casey³,Zakhidov Alex¹²^ORCID

Affiliation:

1. Materials Science Engineering and Commercialization, Texas State University, San Marcos, Texas 78666, USA

2. Department of Physics, Texas State University, San Marcos, Texas 78666, USA

3. Shared Research Operations, Texas State University, San Marcos, Texas 78666, USA

Funder

National Science Foundation

American Chemical Society Petroleum Research Fund

Office of Naval Research

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5125686

Reference29 articles.

1. Advances and challenges to the commercialization of organic–inorganic halide perovskite solar cell technology

2. Challenges for commercializing perovskite solar cells

3. Tailoring nucleation and grain growth by changing the precursor phase ratio for efficient organic lead halide perovskite optoelectronic devices

4. Recent Progress on the Long-Term Stability of Perovskite Solar Cells

5. Techniques and Challenges for Characterizing Metal Thin Films with Applications in Photonics

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry;Results in Optics;2024-05

2. NiO thickness measurement using a rectangular-type Sagnac interferometer as the material transport layer in a perovskite solar cell;Applied Optics;2024-04-03

3. Effect of PEDOT:PSS optical properties at the frontal interface on electrical performance in MAPbI3 perovskite solar cells;Optical Materials;2024-04

4. Physically realistic, parametric model for excitonic critical point parabolic band oscillators;Applied Physics Letters;2023-12-18

5. Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer;Applied Optical Metrology V;2023-10-04

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