Fast detection of largest repeating layout pattern-Reference-Cited by-同舟云学术

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Fast detection of largest repeating layout pattern

Published:2019-03-20 Issue: Volume: Page:
ISSN:
Container-title:Design-Process-Technology Co-optimization for Manufacturability XIII
language:
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Author:

Chen Jingsong,Shiely James,Young Evangeline F.Y.

Publisher

SPIE

Reference6 articles.

1. Efficient process-hotspot detection using range pattern matching;Yao,2006

2. Signature indexing of design layouts for hotspot detection;Andrades,2014

3. iclaire: A fast and general layout pattern classification algorithm;Chang,2017

4. A novel algorithm for automatic arrays detection in a layout;Shafee,2013

5. Iccad-2016 cad contest in pattern classification for integrated circuit design space analysis and benchmark suite;Topaloglu,2016

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Layout Hotspot Pattern Clustering Using a Density-based Approach;2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT);2023-04-17

2. Layout pattern generation and legalization with generative learning models;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02

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