1. Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition
2. One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
3. Automatic Neighbor r Selection for One-dimensional DFT Method in the Surface Defect Inspection of TFT-LCD;Zhang;China Mechanical Engineering,2016
4. Automatic period selection for DFT method in the application of TFT-LCD panel detection;Zhang;Journal of Electronic Measurement and Instrumentation,2016
5. Surface defect inspection of TFT-LCD panels based on 1D Fourier method;Zhang,2016