Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition-Reference-Cited by-同舟云学术

Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition

Published:2005-11 Issue:21 Volume:43 Page:4589-4607
ISSN:0020-7543
Container-title:International Journal of Production Research
language:en
Short-container-title:International Journal of Production Research

Author:

Tsai D.-M.,Hung C.-Y.

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management

Link

http://www.tandfonline.com/doi/pdf/10.1080/00207540500140732

Reference15 articles.

1. An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modelling of optical measurements

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