Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction-Reference-Cited by-同舟云学术

Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction

Published:2021-10-01 Issue:10 Volume:92 Page:103701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Zhang Tengda¹,Dong Jingtao¹^ORCID,Yang Lei¹^ORCID,Liu Shanlin¹,Lu Rongsheng¹^ORCID

Affiliation:

1. Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Optoelectronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China

Funder

National Key Research and Development Program of China

National Key Scientific Instrument and Equipment Development Projects of China

National Natural Science Foundation of China

Open Foundation of Key Laboratory of High-Power Laser and Physics, Chinese Academy of Science

Open Foundation of Key Laboratory of Opto-Electronic Information Acquisition and Manipulation of Ministry of Education

Publisher

AIP Publishing

Subject

Instrumentation

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0060636

Reference29 articles.

1. Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition

2. Automatic defect inspection for LCDs using singular value decomposition

3. Independent component analysis-based defect detection in patterned liquid crystal display surfaces

4. Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis

5. Automatic inline defect detection for a thin film transistor–liquid crystal display array process using locally linear embedding and support vector data description