Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition-Reference-Cited by-同舟云学术

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Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition

Published:2004-10-15 Issue:20 Volume:42 Page:4331-4351
ISSN:0020-7543
Container-title:International Journal of Production Research
language:en
Short-container-title:International Journal of Production Research

Author:

Lu C.-J.¹²,Tsai * D.-M.¹²

Affiliation:

1. a Department of Industrial Engineering and Management , Yuan-Ze University , 135 Yuan-Tung Road, Nei-Li, Tao-Yuan, Taiwan, ROC

2. b Department of Industrial Engineering and Management , Yuan-Ze University , 135 Yuan-Tung Road, Nei-Li, Tao-Yuan, Taiwan, ROC E-mail:

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management

Link

https://www.tandfonline.com/doi/pdf/10.1080/00207540410001716480

Reference30 articles.

1. Bingham E Heikki M 2001 Random projection in dimensionality reduction: applications to image and text data In Proceedings of the Seventh ACM SIGKDD International Conference on Knowledge Discovery and Data Mining San Francisco, CA USA pp. 245–250

2. Singular value decomposition and wavy reflections in ground-penetrating radar images of base surge deposits

3. An Eigenspace Update Algorithm for Image Analysis

4. An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modelling of optical measurements

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1. Automatic defect inspection of thin film transistor-liquid crystal display panels using robust one-dimensional Fourier reconstruction with non-uniform illumination correction;Review of Scientific Instruments;2021-10-01

2. A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry;IEEE Access;2020

3. Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices;Electronics;2019-05-12

4. Integrating image processing and classification technology into automated polarizing film defect inspection;Optics and Lasers in Engineering;2018-05

5. Review on Automated Optical (Visual) Inspection and Its Applications in Defect Detection;Acta Optica Sinica;2018

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