Measurement of in-plane displacement with twofold sensitivity using phase reversal technique
Author:
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference8 articles.
1. P. K. Rastogi, “Techniques of displacement and deformation measurements in speckle metrology,” Chap. 2 inSpeckle Metrology, R. S. Sirohi, Ed., pp. 41–98, Marcel Dekker, New York (1993).
2. Interferometric displacement measurement on scattering surfaces utilizing speckle effect
3. In-plane displacement measurement configuration with twofold sensitivity
4. Twofold increase in sensitivity with a dual‐beam illumination arrangement for electronic speckle pattern interferometry
5. Fringe formation in an in-plane displacement measurement configuration with twofold increase in sensitivity: theory and experiment
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1. Speckle Methods and Applications;Handbook of Optical Metrology;2009-02-25
2. Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting;Optics Communications;2007-04
3. Three-dimensional displacement measurement by using reversed phase-shifting electronic speckle pattern interferometry;Optical Engineering;2006-09-01
4. Recent developments in digital speckle pattern interferometry;Optics and Lasers in Engineering;2003-11
5. Optical image processing using phase reversal Twyman-Green interferometer;SPIE Proceedings;2002-07-31
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