Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting-Reference-Cited by-同舟云学术

Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting

Published:2007-04 Issue:1 Volume:272 Page:9-14
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Bhaduri Basanta,Kothiyal M.P.,Krishna Mohan N.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Speckle Metrology;Sirohi,1993

2. Optical Measurement Techniques and Applications;Jonathan,1997

3. Digital Speckle Pattern Interferometry and Related Techniques;Rastogi,2001

4. Interferometric displacement measurement on scattering surfaces utilizing speckle effect

5. In-plane displacement measurement configuration with twofold sensitivity

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