Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry-Reference-Cited by-同舟云学术

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Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry

Published:2020-02-06 Issue: Volume: Page:
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Container-title:Fourteenth International Conference on Correlation Optics
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Author:

Fodchuk Ihor,Kuzmin Andrii,Hutsuliak Ivan,Solodkyi Mykola,Dovganyuk Volodymyr,Maslyanchuk Olena,Roman Yurii,Zaplitnyy Ruslan,Gudymenko Oleksandr,Kladko Vasyl,Mоlоdkin Vadym,Lizunov Vyacheslav

Publisher

SPIE

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect structure of high-resistance CdTe:Cl single crystals and MoOx/CdTe:Cl/MoOx heterostructures according to the data of high-resolution X-ray diffractometry;Semiconductor Physics, Quantum Electronics and Optoelectronics;2023-12-05

2. Influence of dislocation structure on electrical and spectroscopic properties of MoOx/p-CdTe/MoOx heterostructures;Physics and Chemistry of Solid State;2022-03-19

3. High-Resolution X-Ray Diffractometry of Crystalline Compounds with Developed Dislocation Structure;METALLOFIZIKA I NOVEISHIE TEKHNOLOGII;2021-12-29

4. Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry;Fifteenth International Conference on Correlation Optics;2021-12-21

5. X-ray diffraction and scanning electron microscopy of concrete composites of high structural strength and density;Fifteenth International Conference on Correlation Optics;2021-12-21

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