EUV optical characterization of alternative membrane materials for EUV pellicles-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

EUV optical characterization of alternative membrane materials for EUV pellicles

Published:2017-10-16 Issue: Volume: Page:
ISSN:
Container-title:Photomask Technology
language:
Short-container-title:

Author:

Scholze Frank,Laubis Christian,Timmermans Marina Y.,Pollentier Ivan,Gallagher Emily E.,Krumrey Michael

Publisher

SPIE

Reference19 articles.

1. Pellicle protection of integrated circuit (IC) masks;Hershel,1981

2. Pellicle for ArF excimer laser photolithography;Sakurai,1999

3. EUV lithography industry status: progress and challenges;Hendrickx;Semicon Europa, Oct.25–27, Grenoble,2016

4. Thermo-mechanical behavior of EUV pellicle under dynamic exposure conditions;Goldfarb,2016

5. NXE pellicle: development update;Brouns,2016

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Renewable single-walled carbon nanotube membranes for extreme ultraviolet pellicle applications;Carbon;2022-10

2. The EUV CNT pellicle: balancing material properties to optimize performance;Extreme Ultraviolet (EUV) Lithography XI;2020-03-23

3. Experimental evaluation of the impact of carbon nanotube EUV pellicles on reticle imaging;Journal of Micro/Nanolithography, MEMS, and MOEMS;2019-03-13

4. Free-standing carbon nanotube films for extreme ultraviolet pellicle application;Journal of Micro/Nanolithography, MEMS, and MOEMS;2018-11-27

5. Experimental evaluation of the impact of EUV pellicles on reticle imaging;Photomask Technology 2018;2018-10-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP