Modeling of the impact of current crowding on catastrophic optical damage in 9xx-nm high power laser diodes-Reference-Cited by-同舟云学术

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Modeling of the impact of current crowding on catastrophic optical damage in 9xx-nm high power laser diodes

Published:2021-03-05 Issue: Volume: Page:
ISSN:
Container-title:High-Power Diode Laser Technology XIX
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Author:

Adams Martin,Rauch Simon,Holly Carlo,Traub Martin,Hoffmann Hans-Dieter

Publisher

SPIE

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Industry and academia: pursuing a PhD at Fraunhofer, the best of both worlds;High Power Lasers for Fusion Research VII;2023-03-14

2. Catastrophic optical damage in 808 nm broad area laser diodes: a study of the dark line defect propagation;Optics Express;2022-11-04

3. Multiphysics modeling of feedback-induced catastrophic optical damage in 9xx-nm high-power laser diodes;High-Power Diode Laser Technology XX;2022-03-04

4. Catastrophic Optical Damage in Semiconductor Lasers: Physics and New Results on InGaN High‐Power Diode Lasers;physica status solidi (RRL) – Rapid Research Letters;2021-12-13

5. Mode engineering of semiconductor lasers with vertical periodic layered structures;Journal of Physics D: Applied Physics;2021-11-01

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