Reference17 articles.
1. Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental environment, Shi, L., Nihtianov, S., Nanver, L.K. and Scholze, F., IEEE Sensor J., 13 (2013) 1699
2. Soft X-ray free-electron laser induced damage to inorganic scintillators, Burian, T., et. al., Opt. Mat. Express 5 (2015) 254
3. Über einen die Erzeugung und Verwandlung des Lichtes betreffenden heuristischen Gesichtspunkt, Einstein, A., Annalen der Physik 322 (1905) 132
4. Physical properties of the HCT EUV source, Pankert, J., et al., Proc. SPIE 4688 (2002) 87, doi: 10.1117/12.472271
5. Physical properties of the HCT EUV source, Pankert, J., et al., Proc. SPIE 5037 (2003) 112 doi: 10.1117/12.483611
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