Evaluation of Ta-Co alloys as novel high-k EUV mask absorber

Author:

Thakare Devesh,Wu Meiyi,Opsomer Karl,Detavernier Christophe,Naujok Philipp,Saadeh Qais,Soltwisch Victor,Delabie Annelies,Philipsen Vicky

Publisher

SPIE

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Identifying new absorber materials for EUV photomasks;Photomask Technology 2023;2023-11-21

2. Mask absorber, mask tone, and wafer process impact on resist line-edge-roughness;Journal of Micro/Nanopatterning, Materials, and Metrology;2023-10-13

3. Exploring photomask etching capabilities for new extreme ultraviolet absorber materials;Photomask Japan 2023: XXIX Symposium on Photomask and Next-Generation Lithography Mask Technology;2023-09-29

4. On the optical constants of cobalt in the M-absorption edge region;Optik;2023-02

5. Tunability of the optical constants of tantalum-cobalt alloy thin films in the extreme ultraviolet;Optical Materials Express;2022-12-09

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