1. Resolution Enhancement Techniques in Optical Lithography
2. Assist Feature OPC Implementation for the 130 nm Technology Node with KrF and No Forbidden Pitches;Word,2002
3. Automatic SRAF printing detection based on contour extraction;Liang,2017
4. New Process Models for OPC at sub-90nm Nodes;Granik,2003
5. Calibration of OPC Models for Multiple Focus Conditions;Schacht,2004