Author:
Paramonov Pavel,Renders Jens,Elberfeld Tim,De Beenhouwer Jan,Sijbers Jan
Cited by
3 articles.
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1. A Condensed History Approach to X-Ray Dark Field Effects in Edge Illumination Phase Contrast Simulations;2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC);2023-07-24
2. Enhancing Industrial Inspection with Efficient Edge Illumination X-Ray Phase Contrast Simulations;IEEE EUROCON 2023 - 20th International Conference on Smart Technologies;2023-07-06
3. Recent trends in hard X-ray tomographic imaging;Developments in X-Ray Tomography XIV;2022-11-22