Enhancing Industrial Inspection with Efficient Edge Illumination X-Ray Phase Contrast Simulations
Author:
Affiliation:
1. University of Antwerp,Imec-Vision Lab,Dept. of physics,Antwerp,Belgium
Funder
Research Foundation Flanders
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10198869/10198877/10199074.pdf?arnumber=10199074
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1. Augmenting a conventional x-ray scanner with edge illumination-based phase contrast imaging: how to design the gratings
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3. Dark Field Sensitivity In Single Mask Edge Illumination Lung Imaging
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5. The relationship between wave and geometrical optics models of coded aperture type x-ray phase contrast imaging systems
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1. Edge illumination x-ray phase contrast simulations using the CAD-ASTRA toolbox;Optics Express;2024-03-05
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