Author:
Danneville Francois,Pailloncy Guillaume,Siligaris Alexandre,Iniguez Benjamin,Dambrine Gilles
Cited by
8 articles.
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1. Nanoscale FETs;Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications;2012
2. Interpreting Transistor Noise;IEEE Microwave Magazine;2010-10
3. Microwave Noise and FET Devices;IEEE Microwave Magazine;2010-10
4. Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs;IEEE Transactions on Electron Devices;2009-07
5. MOSFETs RF Noise Optimization via Channel Engineering;IEEE Electron Device Letters;2008-01