1. Testing CMOS logic gates for realistic shorts;Chess,1994
2. Fault characterization of standard cell libraries using inductive contamination analysis (ICA);Khare,1996
3. CMOS Standard Cells Characterization for Defect Based Testing;Pleskacz,2001
4. Improvement of integrated circuit testing reliability by using the defect based approach
5. Characterization of CMOS Sequential Standard Cells for Defect Based Voltage Testing;Wielgus,2008