Thickness-dependent free-electron relaxation time of Au thin films in near-infrared region-Reference-Cited by-同舟云学术

Thickness-dependent free-electron relaxation time of Au thin films in near-infrared region

Published:2016-05-12 Issue:3 Volume:10 Page:033009
ISSN:1934-2608
Container-title:Journal of Nanophotonics
language:en
Short-container-title:J. Nanophoton

Author:

Zhang Ming-Ying¹,Wang Zi-Yi¹,Zhang Tian-Ning²,Zhang Yun²,Zhang Rong-Jun¹,Chen Xin²,Sun Yan²,Zheng Yu-Xiang¹,Wang Song-You¹,Chen Liang-Yao¹

Affiliation:

1. Fudan University, Department of Optical Science and Engineering, 220 Handan Road, Shanghai 200433, China

2. Chinese Academy of Sciences, Shanghai Institute of Technical Physics, National Laboratory of Infrared Physics, 500 Yutian Road, Shanghai 200083, China

Publisher

SPIE-Intl Soc Optical Eng

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. Plasmon-Induced Transparency in Metamaterials

2. Infrared Perfect Absorber and Its Application As Plasmonic Sensor

3. Vapor-deposited amorphous metamaterials as visible near-perfect absorbers with random non-prefabricated metal nanoparticles

4. Properties and applications of protein-stabilized fluorescent gold nanoclusters: short review

5. Thin-film, wide-angle, design-tunable, selective absorber from near UV to far infrared

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