Reliability and performance of 808-nm single emitter multi-mode laser diodes-Reference-Cited by-同舟云学术

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Reliability and performance of 808-nm single emitter multi-mode laser diodes

Published:2010-02-11 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Wang J.,Bao L.,Devito M.,Xu D.,Wise D.,Grimshaw M.,Dong W.,Zhang S.,Bai C.,Leisher P.,Li D.,Zhou H.,Patterson S.,Martinsen R.,Haden J.

Publisher

SPIE

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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