Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam-Reference-Cited by-同舟云学术

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Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam

Published:2019-04-24 Issue: Volume: Page:
ISSN:
Container-title:Optics Damage and Materials Processing by EUV/X-ray Radiation VII
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Author:

Bonfigli Francesca,Hartley Nickolas,Inubushi Yuichi,Koenig M.,Matsuoka Takeshi,Makarov S.,Montereali R.M.,Nichelatti E.,Ozaki N.,Piccinini M.,Pikuz S.,Pikuz Tatiana A.,Sagae Daisuke,Vincenti M. A.,Yabashi Makina,Yabuuchi Toshinori

Publisher

SPIE

Reference19 articles.

1. Optical Properties of SomeF-Aggregate Centers in LiF

2. Scanning near-field optical microscopy images of microradiographs stored in lithium fluoride films with an optical resolution of λ∕12

3. Hard x-ray contact microscopy with 250nm spatial resolution using a LiF film detector and a tabletop microsource

4. Soft x-ray submicron imaging detector based on point defects in LiF

5. LiF detectors-polycapillary lens for advanced X-ray imaging

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advanced spectroscopic investigation of colour centres in LiF crystals irradiated with monochromatic hard x-rays;Journal of Physics: Condensed Matter;2024-02-16

2. Confocal Fluorescence Microscopy and Confocal Raman Microspectroscopy of X-ray Irradiated LiF Crystals;Condensed Matter;2021-10-20

3. Photoluminescent radiation-induced color centers in lithium fluoride for detection of pulsed 10 keV XFEL beam;NUOVO CIM C-COLLOQ C;2021

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