Soft x-ray submicron imaging detector based on point defects in LiF-Reference-Cited by-同舟云学术

Soft x-ray submicron imaging detector based on point defects in LiF

Published:2005-11 Issue:11 Volume:76 Page:113104
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Baldacchini G.,Bollanti S.,Bonfigli F.,Flora F.,Di Lazzaro P.,Lai A.,Marolo T.,Montereali R. M.,Murra D.,Faenov A.,Pikuz T.,Nichelatti E.,Tomassetti G.,Reale A.,Reale L.,Ritucci A.,Limongi T.,Palladino L.,Francucci M.,Martellucci S.,Petrocelli G.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2130930

Reference44 articles.

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5. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92

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