Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications-Reference-Cited by-同舟云学术

Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications

Published:2015-03-02 Issue:3 Volume:54 Page:035101
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Zápražný Zdenko¹,Korytár Dušan¹,Jergel Matej²,Šiffalovic Peter²,Dobrocka Edmund¹,Vagovic Patrik³,Ferrari Claudio⁴,Mikulík Petr⁵,Demydenko Maksym⁶,Mikloška Marek⁷

Affiliation:

1. Slovak Academy of Sciences, Institute of Electrical Engineering, Dúbravská cesta 9, 845 11 Bratislava, Slovakia

2. Slovak Academy of Sciences, Institute of Physics, Dúbravská cesta 9, 845 11 Bratislava, Slovakia

3. DESY, Center for Free-Electron Laser Science, Notkestrasse 85, 226 07 Hamburg, Germany

4. CNR-IMEM Institute, Parco Area delle Scienze 37/A, 431 24 Parma, Italy

5. Masaryk University, Central European Institute of Technology, Kotlárska 2, 611 37 Brno, Czech Republic

6. Slovak Academy of Sciences, Institute of Physics, Dúbravská cesta 9, 845 11 Bratislava, SlovakiafSumy State University, R.-Korsakov Str. 2, 40007 Sumy, Ukraine

7. Integra TDS, s.r.o., Pod Párovcami 4757/25, 921 01 Piešt’any, Slovakia

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

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