Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Reference9 articles.
1. D. Malacara, M. Servı́n, and Z. Malacara,Interferogram Analysis for Optical Testing, Chaps. 1, 5–8, Marcel Dekker, New York (1996).
2. J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometry,” Chap. 14 inOptical Shop Testing, 2nd ed., D. Malacara, Ed., pp. 501–598, Wiley, New York (1992).
3. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
4. Optical constant determination of thin films: an analytical solution
5. Asymptotic wavelet and Gabor analysis: extraction of instantaneous frequencies
Cited by
39 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. New Methods of Speckle Metrology in Analysis of Rough Surfaces;Optical Metrology and Optoacoustics in Nondestructive Evaluation of Materials;2023
2. Digital Speckle Pattern Interferometry for Studying Surface Deformation and Fracture of Materials;Optical Metrology and Optoacoustics in Nondestructive Evaluation of Materials;2023
3. Correction of wavelength error of white-light interference phase-shifting algorithm;10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing and Metrology Technologies;2021-12-13
4. Two-Frame Phase Shift Extraction Algorithm Based on Gradient Descent Algorithm;Laser & Optoelectronics Progress;2020
5. Three-step electronic speckle pattern interferometry method with arbitrary phase shifts of reference wave;Information extraction and processing;2019-12-26