Demonstrating repetitive non-destructive readout with SiSeRO devices-Reference-Cited by-同舟云学术

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Demonstrating repetitive non-destructive readout with SiSeRO devices

Published:2024-01-08 Issue:01 Volume:10 Page:
ISSN:2329-4124
Container-title:Journal of Astronomical Telescopes, Instruments, and Systems
language:
Short-container-title:J. Astron. Telesc. Instrum. Syst.

Author:

Chattopadhyay Tanmoy¹,Herrmann Sven¹,Orel Peter¹,Donlon Kevan²,Prigozhin Gregory³,Morris Glenn¹,Cooper Michael²,LaMarr Beverly³,Malonis Andrew³,Allen Steven W.¹,Bautz Marshall W.³,Leitz Chris²

Affiliation:

1. Stanford University, Kavli Institute of Astrophysics and Cosmology, Stanford, California, United States

2. MIT Lincoln Laboratory, Lexington, Massachusetts, United States

3. Kavli Institute for Astrophysics and Space Research, Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Publisher

SPIE-Intl Soc Optical Eng

Reference32 articles.

1. New advancements in charge-coupled device technology – sub-electron noise and 4096 X 4096 pixel CCDs;Janesick,1990

2. Soft X-ray spectroscopy with sub-electron readnoise charge-coupled devices

3. Single-Electron and Single-Photon Sensitivity with a Silicon Skipper CCD

4. Absolute measurement of the Fano factor using a Skipper-CCD

5. Sub-electron noise measurements on repetitive non-destructive readout devices

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