Sub-electron noise measurements on repetitive non-destructive readout devices

Author:

Wölfel Stefan,Herrmann Sven,Lechner Peter,Lutz Gerhard,Porro Matteo,Richter Rainer,Strüder Lothar,Treis Johannes

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Demonstrating repetitive non-destructive readout with SiSeRO devices;Journal of Astronomical Telescopes, Instruments, and Systems;2024-01-08

2. Design and Simulation of a Highly Sensitive Charge Detector With Nondestructive Readout Mode for Fully Depleted Thick CCDs;IEEE Transactions on Electron Devices;2023-02

3. X-ray speed reading with the MCRC: a low noise CCD readout ASIC enabling readout speeds of 5 Mpixel/s/channel;X-Ray, Optical, and Infrared Detectors for Astronomy X;2022-08-29

4. Single electron sensitive readout (SiSeRO) x-ray detectors: technological progress and characterization;X-Ray, Optical, and Infrared Detectors for Astronomy X;2022-08-29

5. First results on SiSeRO devices: a new x-ray detector for scientific instrumentation;Journal of Astronomical Telescopes, Instruments, and Systems;2022-05-26

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