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2. An evaluation of errors in determining the refractive index and thickness of thin SiO2 films using a rotating analyzer ellipsometer
3. Limits to the precision of electrooptic and magneto-optic sensors,;Day,1987
4. Surface and Interface Analysis
5. “ISO/IEC GUIDE 98-3/Suppl.1: 2008 Uncertainty of measurement-Part 3: Guide to the expression of uncertainty in measurement (GUM: 1995) Supplement: Propagation of distribution using a Monte Carlo method”