Extended linear polarimeter to measure retardance and flicker: application to liquid crystal on silicon devices in two working geometries-Reference-Cited by-同舟云学术

Extended linear polarimeter to measure retardance and flicker: application to liquid crystal on silicon devices in two working geometries

Published:2014-01-21 Issue:1 Volume:53 Page:014105
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Martínez Francisco J.¹,Márquez Andrés¹,Gallego Sergi¹,Francés Jorge¹,Pascual Inmaculada²

Affiliation:

1. Universidad de Alicante, Dept. de Física, Ing. de Sistemas y T. Señal, Ap. 99, Alicante, E-03080, SpainbUniversidad de Alicante, I.U. Física Aplicada a las Ciencias y las Tecnologías, Ap. 99, Alicante, E-03080, Spain

2. Universidad de Alicante, I.U. Física Aplicada a las Ciencias y las Tecnologías, Ap. 99, Alicante, E-03080, SpaincUniversidad de Alicante, Dept. de Óptica, Farmacología y Anatomía, Ap. 99, Alicante, E-03080, Spain

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference31 articles.

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2. The Applications and Technology of Phase-Only Liquid Crystal on Silicon Devices

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