Multilayers for EUV, soft x-ray and x-ray optics-Reference-Cited by-同舟云学术

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Multilayers for EUV, soft x-ray and x-ray optics

Published:2016-05-02 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX
language:
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Author:

Wang Zhanshan,Huang Qiushi,Zhang Zhong

Publisher

SPIE

Reference34 articles.

1. D. Attwood, [Soft x-rays and extreme ultraviolet radiation: principles and applications], Cambridge University Press, London, 2000.

2. Nanometer interface and materials control for multilayer EUV-optical applications

3. Initial Calibration of the Atmospheric Imaging Assembly (AIA) on the Solar Dynamics Observatory (SDO)

4. Lithography gets extreme

5. Sub-38 nm resolution tabletop microscopy with 13 nm wavelength laser light

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Performance characterization of an Al₂O₃/HfO₂ parabolic multilayer based on a laboratory X-ray source;Applied Optics;2024-07-31

2. Highly reflective Ru/Y multilayer mirrors for the spectral range of 9-11 nm;Optics Express;2022-05-18

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