Author:
Yamamoto Yuji,Goritz Alexander,Korndoerfer Falk,Zaumseil Peter,Kulse Philipp,Schulz Katrin,Wietstruck Matthias,Shafique Atia,Gurbuz Yasar,Kaynak Mehmet,Baristiran Kaynak Canan,Costina Ioan
Cited by
1 articles.
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1. Layer Transfer Process Development For SiGe Based Microbolometer Integration;2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC);2020-09-15