High-aperture monochromator-reflectometer and its usefulness for CCD calibration
Author:
Affiliation:
1. P.N. Lebedev Physical Institute (Russian Federation)
2. Institute for Physics of Microstructures (Russian Federation)
Publisher
SPIE
Reference26 articles.
1. Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands
2. Aperiodic multilayer structures in soft X-ray radiation optics
3. Dispersive reflecting multilayer elements based on Mg intended for operation at the wavelength 30.4 nm;Andreev;[In Russian], J. Surf. Investigations: X-Ray, Synchrotron and Neutron Tech.,2005
4. Multilayer thin-film filters of extreme ultraviolet and soft X-ray spectral regions
5. Enabling high-resolution extreme UV solar astronomy;Shestov;SPIE Newsroom,2014
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