High-aperture monochromator-reflectometer and its usefulness for CCD calibration

Author:

Vishnyakov Eugene A.1,Shcherbakov Alexander V.2,Pertsov Andrei A.1,Polkovnikov Vladimir N.2,Pestov Alexey E.2,Pariev Dmitry E.2,Chkhalo Nikolai I.2

Affiliation:

1. P.N. Lebedev Physical Institute (Russian Federation)

2. Institute for Physics of Microstructures (Russian Federation)

Publisher

SPIE

Reference26 articles.

1. Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands

2. Aperiodic multilayer structures in soft X-ray radiation optics

3. Dispersive reflecting multilayer elements based on Mg intended for operation at the wavelength 30.4 nm;Andreev;[In Russian], J. Surf. Investigations: X-Ray, Synchrotron and Neutron Tech.,2005

4. Multilayer thin-film filters of extreme ultraviolet and soft X-ray spectral regions

5. Enabling high-resolution extreme UV solar astronomy;Shestov;SPIE Newsroom,2014

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