Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement-Reference-Cited by-同舟云学术

Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement

Published:2017-06-15 Issue:6 Volume:56 Page:066107
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Gao Xinya¹,Wang Yonghong¹,Li Junrui²,Dan Xizuo¹,Wu Sijin³,Yang Lianxiang⁴

Affiliation:

1. Hefei University of Technology, School of Instrument Science and Opto-Electronics Engineering, Hefei, China

2. Oakland University, Department of Mechanical Engineering, Rochester, Michigan, United States

3. Beijing Information Science and Technology University, Department of Measurement-Control Technology and Instrumentation, Beijing, China

4. Hefei University of Technology, School of Instrument Science and Opto-Electronics Engineering, Hefei, ChinabOakland University, Department of Mechanical Engineering, Rochester, Michigan, United StatescBeijing Information Science and Technology University, Department of Measurement-Control Technology and Instrumentation, Beijing, China

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dynamic three-dimensional deformation measurement by polarization-multiplexing of full complex amplitude;Optics Express;2024-03-15

2. Measurement of absolute three-dimensional displacement gradients using tri-color quad-beam digital shearography;Optoelectronics Letters;2023-08

3. Simultaneous 3D measurement for infrared chips with speckle interferometry;Optics & Laser Technology;2022-09

4. Tri-wavelength simultaneous ESPI for 3D micro-deformation field measurement;Applied Optics;2022-01-10

5. Applications of digital speckle pattern shearing interferometry in characterization of fluids;Applied Optics;2021-12-13