Author:
Li Xuan,Wu Sijin,Tang Xiaojun,Li Weixian
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. LEENDERT J A, BUTTERS J N. An image-shearing speckle-pattern interferometer for measuring bending moments[J]. Journal of physics E: scientific instruments, 1973, 6(11): 1107–1110.
2. WANG Y H, YAO Y F, LI J R, et al. Progresses of shearography: key technologies and applications[J]. Laser & optoelectronics progress, 2022, 59(14): 53–61.
3. ZHAO Q H, CHEN W J, SUN F Y, et al. Simultaneous 3D measurement of deformation and its first derivative with speckle pattern interferometry and shearography[J]. Applied optics, 2019, 58(31): 8665–8672.
4. WU S J, LI X, LI W X, et al. Non-contact and fast measurement of small roll angle using digital shearography[J]. Optics and lasers in engineering, 2022, 150: 106846.
5. YAN P Z, SUN F Y, DAN X Z, et al. Spatial phase-shift digital shearography for simultaneous measurements in three shearing directions based on adjustable aperture multiplexing[J]. Optical engineering, 2019, 58(5): 054105.